diff --git a/contributed_definitions/NXafm.nxdl.xml b/applications/NXafm.nxdl.xml similarity index 100% rename from contributed_definitions/NXafm.nxdl.xml rename to applications/NXafm.nxdl.xml diff --git a/contributed_definitions/NXsensor_scan.nxdl.xml b/applications/NXsensor_scan.nxdl.xml similarity index 100% rename from contributed_definitions/NXsensor_scan.nxdl.xml rename to applications/NXsensor_scan.nxdl.xml diff --git a/contributed_definitions/NXspm.nxdl.xml b/applications/NXspm.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm.nxdl.xml rename to applications/NXspm.nxdl.xml diff --git a/contributed_definitions/NXstm.nxdl.xml b/applications/NXstm.nxdl.xml similarity index 100% rename from contributed_definitions/NXstm.nxdl.xml rename to applications/NXstm.nxdl.xml diff --git a/contributed_definitions/NXsts.nxdl.xml b/applications/NXsts.nxdl.xml similarity index 100% rename from contributed_definitions/NXsts.nxdl.xml rename to applications/NXsts.nxdl.xml diff --git a/contributed_definitions/NXamplifier.nxdl.xml b/base_classes/NXamplifier.nxdl.xml similarity index 100% rename from contributed_definitions/NXamplifier.nxdl.xml rename to base_classes/NXamplifier.nxdl.xml diff --git a/contributed_definitions/NXlockin.nxdl.xml b/base_classes/NXlockin.nxdl.xml similarity index 100% rename from contributed_definitions/NXlockin.nxdl.xml rename to base_classes/NXlockin.nxdl.xml diff --git a/contributed_definitions/NXphase_lock_loop.nxdl.xml b/base_classes/NXphase_lock_loop.nxdl.xml similarity index 100% rename from contributed_definitions/NXphase_lock_loop.nxdl.xml rename to base_classes/NXphase_lock_loop.nxdl.xml diff --git a/contributed_definitions/NXrcs.nxdl.xml b/base_classes/NXrcs.nxdl.xml similarity index 100% rename from contributed_definitions/NXrcs.nxdl.xml rename to base_classes/NXrcs.nxdl.xml diff --git a/contributed_definitions/NXspm_bias_spectroscopy.nxdl.xml b/base_classes/NXspm_bias_spectroscopy.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_bias_spectroscopy.nxdl.xml rename to base_classes/NXspm_bias_spectroscopy.nxdl.xml diff --git a/contributed_definitions/NXspm_cantilever.nxdl.xml b/base_classes/NXspm_cantilever.nxdl.xml similarity index 57% rename from contributed_definitions/NXspm_cantilever.nxdl.xml rename to base_classes/NXspm_cantilever.nxdl.xml index 54cdbae4d4..24644fd929 100644 --- a/contributed_definitions/NXspm_cantilever.nxdl.xml +++ b/base_classes/NXspm_cantilever.nxdl.xml @@ -1,10 +1,10 @@ - + - - - A base class to describe the cantilever used in Atomic Force Microscopy (AFM). - - + + - The oscillator of the cantilever. + The symbols used in the schema to specify e.g. dimensions of arrays. - - + + + Computer science description of a storage object in an input/output system. + + - The configuration parameters of the cantilever used in scanning probe - microscopy. + Qualifier for the type of storage medium used. - - + + + + + + + + - The phase positioner of the cantilever. + Total amount of data which the medium can hold. - - + + + - The amplitude positioner of the cantilever. + Given name to the I/O unit. - + + diff --git a/contributed_definitions/NXspm_cantilever_config.nxdl.xml b/base_classes/NXspm_cantilever_config.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_cantilever_config.nxdl.xml rename to base_classes/NXspm_cantilever_config.nxdl.xml diff --git a/contributed_definitions/NXspm_cantilever_oscillator.nxdl.xml b/base_classes/NXspm_cantilever_oscillator.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_cantilever_oscillator.nxdl.xml rename to base_classes/NXspm_cantilever_oscillator.nxdl.xml diff --git a/contributed_definitions/NXspm_piezo_config.nxdl.xml b/base_classes/NXspm_piezo_config.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_piezo_config.nxdl.xml rename to base_classes/NXspm_piezo_config.nxdl.xml diff --git a/contributed_definitions/NXspm_piezo_sensor.nxdl.xml b/base_classes/NXspm_piezo_sensor.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_piezo_sensor.nxdl.xml rename to base_classes/NXspm_piezo_sensor.nxdl.xml diff --git a/contributed_definitions/NXspm_piezoelectric_material.nxdl.xml b/base_classes/NXspm_piezoelectric_material.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_piezoelectric_material.nxdl.xml rename to base_classes/NXspm_piezoelectric_material.nxdl.xml diff --git a/contributed_definitions/NXspm_positioner.nxdl.xml b/base_classes/NXspm_positioner.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_positioner.nxdl.xml rename to base_classes/NXspm_positioner.nxdl.xml diff --git a/contributed_definitions/NXspm_scan_control.nxdl.xml b/base_classes/NXspm_scan_control.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_scan_control.nxdl.xml rename to base_classes/NXspm_scan_control.nxdl.xml diff --git a/contributed_definitions/NXspm_scan_pattern.nxdl.xml b/base_classes/NXspm_scan_pattern.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_scan_pattern.nxdl.xml rename to base_classes/NXspm_scan_pattern.nxdl.xml diff --git a/contributed_definitions/NXspm_scan_region.nxdl.xml b/base_classes/NXspm_scan_region.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_scan_region.nxdl.xml rename to base_classes/NXspm_scan_region.nxdl.xml diff --git a/contributed_definitions/NXspm_temperature_sensor.nxdl.xml b/base_classes/NXspm_temperature_sensor.nxdl.xml similarity index 100% rename from contributed_definitions/NXspm_temperature_sensor.nxdl.xml rename to base_classes/NXspm_temperature_sensor.nxdl.xml diff --git a/dev_tools/docs/nxdl_index.py b/dev_tools/docs/nxdl_index.py index 7e655b6872..fd7e167221 100644 --- a/dev_tools/docs/nxdl_index.py +++ b/dev_tools/docs/nxdl_index.py @@ -23,6 +23,7 @@ "mpes", "optical-spectroscopy", "tof", + "spm", ], "base_classes": [ "core", @@ -35,6 +36,7 @@ "em", "mpes", "optical-spectroscopy", + "spm", ], "contributed_definitions": [ "sample", @@ -44,7 +46,6 @@ "optical-spectroscopy", "transport", "micro", - "spm", ], } @@ -281,6 +282,8 @@ def get_nxclass_description(nxdl_file: Path, namespaces) -> str: :ref:`Optical Spectroscopy ` + :ref:`Scanning Probe Microscopy ` + :ref:`Time-of-Flight Techniques ` """, # - - - - - - - - - - - - - - - - - - - - - - - - - - - - @@ -317,8 +320,6 @@ def get_nxclass_description(nxdl_file: Path, namespaces) -> str: :ref:`Optical Spectroscopy ` - :ref:`Scanning Probe Microscopy ` - :ref:`Transport Measurements ` :ref:`Microstructures Characterization and Representation ` diff --git a/manual/source/classes/contributed_definitions/spm-structure.rst b/manual/source/classes/applications/spm-structure.rst similarity index 99% rename from manual/source/classes/contributed_definitions/spm-structure.rst rename to manual/source/classes/applications/spm-structure.rst index 2518e33948..167d521c61 100644 --- a/manual/source/classes/contributed_definitions/spm-structure.rst +++ b/manual/source/classes/applications/spm-structure.rst @@ -1,4 +1,4 @@ -.. _CC-Spm-Structure: +.. _AppDef-Spm-Structure: =============================== Scanning Probe Microscopy diff --git a/manual/source/classes/base_classes/spm-structure.rst b/manual/source/classes/base_classes/spm-structure.rst new file mode 100644 index 0000000000..371ee6379c --- /dev/null +++ b/manual/source/classes/base_classes/spm-structure.rst @@ -0,0 +1,72 @@ +.. _BC-Spm-Structure: + +========================= +Scanning Probe Microscopy +========================= + +.. index:: + BC-Spm-Introduction + BC-Spm-Classes + +.. _BC-Spm-Introduction: + +Introduction +############ + +These are the base classes to describe components of a scanning probe microscope (SPM) +and its associated experimental configurations. These base classes are used within the +SPM-related :ref:`application definitions `, specifically in +:ref:`NXspm`, :ref:`NXstm`, :ref:`NXsts`, and :ref:`NXafm`. + +.. _BC-Spm-Classes: + +Base Classes +############ + +:ref:`NXamplifier`: + A base class to describe an amplifier instrument. + +:ref:`NXlockin`: + A base class to describe a lock-in amplifier instrument. + +:ref:`NXphase_lock_loop`: + A base class to describe a phase lock loop in AFM experiments. + +:ref:`NXrcs`: + A base class to describe a remote control system. + +:ref:`NXspm_bias_spectroscopy`: + A base class to describe bias spectroscopy measurement to measure I/V curves in STS experiments. + +:ref:`NXspm_cantilever`: + A base class to characterize the cantilever used in AFM experiments. + +:ref:`NXspm_cantilever_config`: + A base class to describe cantilever configuration in AFM experiments. + +:ref:`NXspm_cantilever_oscillator`: + A base class to describe the cantilever oscillator in AFM experiments. + +:ref:`NXspm_piezo_config`: + A base class to describe piezo configuration in SPM experiments. + +:ref:`NXspm_piezo_sensor`: + A base class to describe a piezo sensor in SPM experiments. + +:ref:`NXspm_piezoelectric_material`: + A base class to describe piezoelectric material properties used in a cantilever tip. + +:ref:`NXspm_positioner`: + A base class to describe a PID positioner in SPM experiments. + +:ref:`NXspm_scan_control`: + A base class to characterize the movement of a scan probe in a multi-dimensional phase space. + +:ref:`NXspm_scan_pattern`: + A base class to define the pattern of a scan in a given scan region. + +:ref:`NXspm_scan_region`: + A base class to define the phase space or sub-phase space for a scan in SPM experiments. + +:ref:`NXspm_temperature_sensor`: + A base class to describe a temperature sensor in SPM experiments.