Application Definitions and base classes for SPM family

contributed_definitions/NXspm_cantilever.nxdl.xml → base_classes/NXspm_cantilever.nxdl.xml

@@ -1,10 +1,10 @@
-<?xml version='1.0' encoding='UTF-8'?>
+<?xml version="1.0" encoding="UTF-8"?>
 <?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
 <!--
 # NeXus - Neutron and X-ray Common Data Format
-#
-# Copyright (C) 2024-2026 NeXus International Advisory Committee (NIAC)
-#
+# 
+# Copyright (C) 2014-2024 NeXus International Advisory Committee (NIAC)
+# 
 # This library is free software; you can redistribute it and/or
 # modify it under the terms of the GNU Lesser General Public
 # License as published by the Free Software Foundation; either
@@ -21,29 +21,36 @@
 #
 # For further information, see http://www.nexusformat.org
 -->
-<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="base" type="group" name="NXspm_cantilever" extends="NXobject" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
-    <doc>
-        A base class to describe the cantilever used in Atomic Force Microscopy (AFM).
-    </doc>
-    <group name="cantilever_oscillator" type="NXspm_cantilever_oscillator">
+<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="base" name="NXspm_cantilever" extends="NXobject" type="group" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
+    <symbols>
         <doc>
-            The oscillator of the cantilever.
+             The symbols used in the schema to specify e.g. dimensions of arrays.
         </doc>
-    </group>
-    <group name="cantilever_config" type="NXspm_cantilever_config">
+    </symbols>
+    <doc>
+         Computer science description of a storage object in an input/output system.
+    </doc>
+    <field name="technology">
         <doc>
-            The configuration parameters of the cantilever used in scanning probe
-            microscopy.
+             Qualifier for the type of storage medium used.
         </doc>
-    </group>
-    <group name="phase_positioner" type="NXpositioner">
+        <enumeration>
+            <item value="solid_state_disk"/>
+            <item value="hard_disk"/>
+            <item value="tape"/>
+        </enumeration>
+    </field>
+    <!--recording technique etc.-->
+    <field name="max_physical_capacity" type="NX_NUMBER">
         <doc>
-            The phase positioner of the cantilever.
+             Total amount of data which the medium can hold.
         </doc>
-    </group>
-    <group name="amplitude_positioner" type="NXpositioner">
+    </field>
+    <!--unit: NX_BIT-->
+    <field name="name">
         <doc>
-            The amplitude positioner of the cantilever.
+             Given name to the I/O unit.
         </doc>
-    </group>
+    </field>
+    <group type="NXfabrication"/>
 </definition>

dev_tools/docs/nxdl_index.py

@@ -23,6 +23,7 @@
         "mpes",
         "optical-spectroscopy",
         "tof",
+        "spm",
     ],
     "base_classes": [
         "core",
@@ -35,6 +36,7 @@
         "em",
         "mpes",
         "optical-spectroscopy",
+        "spm",
     ],
     "contributed_definitions": [
         "sample",
@@ -44,7 +46,6 @@
         "optical-spectroscopy",
         "transport",
         "micro",
-        "spm",
     ],
 }
 
@@ -281,6 +282,8 @@ def get_nxclass_description(nxdl_file: Path, namespaces) -> str:
 
   :ref:`Optical Spectroscopy <AppDef-Opt-Spec-Structure>`
 
+  :ref:`Scanning Probe Microscopy <AppDef-Spm-Structure>`
+
   :ref:`Time-of-Flight Techniques <AppDef-Tof-Structure>`
     """,
     # - - - - - - - - - - - - - - - - - - - - - - - - - - - -
@@ -317,8 +320,6 @@ def get_nxclass_description(nxdl_file: Path, namespaces) -> str:
 
   :ref:`Optical Spectroscopy <CC-Opt-Spec-Structure>`
 
-  :ref:`Scanning Probe Microscopy <CC-Spm-Structure>`
-
   :ref:`Transport Measurements <CC-Transport-Structure>`
 
   :ref:`Microstructures Characterization and Representation <CC-Micro-Structure>`

manual/source/classes/contributed_definitions/spm-structure.rst → manual/source/classes/applications/spm-structure.rst

@@ -1,4 +1,4 @@
-.. _CC-Spm-Structure:
+.. _AppDef-Spm-Structure:
 
 ===============================
 Scanning Probe Microscopy

manual/source/classes/base_classes/spm-structure.rst

@@ -0,0 +1,72 @@
+.. _BC-Spm-Structure:
+
+=========================
+Scanning Probe Microscopy
+=========================
+
+.. index::
+   BC-Spm-Introduction
+   BC-Spm-Classes
+
+.. _BC-Spm-Introduction:
+
+Introduction
+############
+
+These are the base classes to describe components of a scanning probe microscope (SPM)
+and its associated experimental configurations. These base classes are used within the
+SPM-related :ref:`application definitions <AppDef-Spm-Structure>`, specifically in
+:ref:`NXspm`, :ref:`NXstm`, :ref:`NXsts`, and :ref:`NXafm`.
+
+.. _BC-Spm-Classes:
+
+Base Classes
+############
+
+:ref:`NXamplifier`:
+    A base class to describe an amplifier instrument.
+
+:ref:`NXlockin`:
+    A base class to describe a lock-in amplifier instrument.
+
+:ref:`NXphase_lock_loop`:
+    A base class to describe a phase lock loop in AFM experiments.
+
+:ref:`NXrcs`:
+    A base class to describe a remote control system.
+
+:ref:`NXspm_bias_spectroscopy`:
+    A base class to describe bias spectroscopy measurement to measure I/V curves in STS experiments.
+
+:ref:`NXspm_cantilever`:
+    A base class to characterize the cantilever used in AFM experiments.
+
+:ref:`NXspm_cantilever_config`:
+    A base class to describe cantilever configuration in AFM experiments.
+
+:ref:`NXspm_cantilever_oscillator`:
+    A base class to describe the cantilever oscillator in AFM experiments.
+
+:ref:`NXspm_piezo_config`:
+    A base class to describe piezo configuration in SPM experiments.
+
+:ref:`NXspm_piezo_sensor`:
+    A base class to describe a piezo sensor in SPM experiments.
+
+:ref:`NXspm_piezoelectric_material`:
+    A base class to describe piezoelectric material properties used in a cantilever tip.
+
+:ref:`NXspm_positioner`:
+    A base class to describe a PID positioner in SPM experiments.
+
+:ref:`NXspm_scan_control`:
+    A base class to characterize the movement of a scan probe in a multi-dimensional phase space.
+
+:ref:`NXspm_scan_pattern`:
+    A base class to define the pattern of a scan in a given scan region.
+
+:ref:`NXspm_scan_region`:
+    A base class to define the phase space or sub-phase space for a scan in SPM experiments.
+
+:ref:`NXspm_temperature_sensor`:
+    A base class to describe a temperature sensor in SPM experiments.